TOF-SIMS 3D ANALYSIS OF THIN FILMS DEPOSITED IN HIGH ASPECT RATIO STRUCTURES VIA ATOMIC LAYER DEPOSITION AND CHEMICAL VAPOR DEPOSITION

ToF-SIMS 3D Analysis of Thin Films Deposited in High Aspect Ratio Structures via Atomic Layer Deposition and Chemical Vapor Deposition

For the analysis of thin films, with high zilla water conditioner aspect ratio (HAR) structures, time-of-flight secondary ion mass spectrometry (ToF-SIMS) overcomes several challenges in comparison to other frequently used techniques such as electron microscopy.The research presented herein focuses on two different kinds of HAR structures that repr

read more

Efektifitas Terapi Seft (Spiritual Emotional Freedom Technique) Terhadap Penurunan Agresifitas Remaja Warga Binaan Lembaga Pembinaan Khusus Anak (LPKA)

Abstrak Penelitian ini bertujuan untuk mengetahui dampak terapi Spiritual Emotional Freedom Technique (SEFT) terhadap penurunan level agresifitas grace in la cactus jeans pada remaja warga binaan di lembaga pembinaan khusus anak.Subjek penelitian adalah enam belas remaja warga binaan lembaga pembinaan Khusus anak kelas I Blitar.Penelitian ini merup

read more